The Uncertainty of the Indirect Thermographic Measurement of the Temperature of the Semiconductor Element. Measurement Science Review, [S. l.], v. 26, n. 3, p. 153–160, 2026. DOI: 10.2478/msr-2026-0019. Disponível em: https://journals.savba.sk/index.php/msr/article/view/5992. Acesso em: 22 oct. 2026.