Low-Frequency Noise Measurement of High-Ohm Resistors. Measurement Science Review, [S. l.], v. 26, n. 4, p. 198–208, 2026. DOI: 10.2478/. Disponível em: https://journals.savba.sk/index.php/msr/article/view/6154. Acesso em: 14 jul. 2026.