PUVANESWARI, G. Parametric Faults Detection in Analog Circuits using Variable Ranking-based Feature Selection Method and Optimized SVM Model. Measurement Science Review, [S. l.], v. 25, n. 1, p. 30–39, 2025. DOI: 10.2478/msr-2025-0005. Disponível em: https://journals.savba.sk/index.php/msr/article/view/2559. Acesso em: 21 jul. 2025.