LU, S.; ZHANG, J.; HAO, F.; JIAO, L. Automatic Detection of Chip Pin Defect in Semiconductor Assembly Using Vision Measurement. Measurement Science Review, [S. l.], v. 22, n. 5, p. 231–240, 2022. DOI: 10.2478/msr-2022-0029. Disponível em: https://journals.savba.sk/index.php/msr/article/view/1443. Acesso em: 2 may. 2024.