An Improved Method for Determination of Refractive Index of Dielectric Films from Reflectance Spectrum by Using the Generalized Morse Wavelet

Authors

  • Erhan Tiryaki Department of Physics, School of Graduate Studies, Canakkale Onsekiz Mart University, 17020, Canakkale, Turkey
  • Özlem Kocahan Department of Physics, Faculty of Arts and Sciences, Namik Kemal University, Tekirdag, 59030, Turkey
  • Serhat Özder Department of Physics, Faculty of Arts and Sciences, Canakkale Onsekiz Mart University, Canakkale, 17020, Turkey

DOI:

https://doi.org/10.2478/msr-2021-0009

Keywords:

dielectric film, refractive index, reflectance spectrum, continuous wavelet transform, generalized Morse wavelet

Abstract

The Generalized Morse Wavelet (GMW) algorithm was adapted to determine the refractive index of dielectric film from the reflectance spectrum. A theoretically generated reflectance spectrum in the range of 300-1200 nm wavelength was analyzed by the Continuous Wavelet Transform (CWT) and the refractive index dispersion was obtained by the mentioned method. In addition, a noisy reflectance spectrum was analyzed to show the advantages of the CWT method. Refractive index dispersions calculated by the Morlet and the Paul wavelet were compared to GMW at the end of the study.

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Published

21.05.2021

How to Cite

Tiryaki, E., Kocahan, Özlem, & Özder, S. (2021). An Improved Method for Determination of Refractive Index of Dielectric Films from Reflectance Spectrum by Using the Generalized Morse Wavelet. Measurement Science Review, 21(2), 61–66. https://doi.org/10.2478/msr-2021-0009

Issue

Vol. 21 No. 2 (2021): Measurement Science Review

Section

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Copyright (c) 2021 Slovak Academy of Sciences - Institute of Measurement Science

Creative Commons License

This work is licensed under a Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.

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