An Experimental Setup for Power Loss Measurement up to 1 kHz using an Epstein Frame at CMI

Authors

DOI:

https://doi.org/10.2478/msr-2023-0035

Keywords:

Epstein, feedback, measurement, power loss, reference sample, uncertainty

Abstract

This paper describes an experimental setup used at the Czech Metrology Institute (CMI) to measure the specific power loss of oriented and non-oriented electrical steel sheets up to 1 kHz using an Epstein frame. Special attention is given to a) a description of the hardware that is used, b) a description of the feedback control and measurement software, and c) an analysis of the sources of uncertainty and validation. Calibration expanded uncertainty of (0.5 up to 1.6)% for k = 2 can be achieved with this setup.

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Published

17.11.2023

How to Cite

Ulvr, M. (2023). An Experimental Setup for Power Loss Measurement up to 1 kHz using an Epstein Frame at CMI. Measurement Science Review, 23(6), 275–280. https://doi.org/10.2478/msr-2023-0035

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